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Determination of the Optical Properties of Implanted Ag Nanoparticles in SiO2 Thin Layer by Spectroscopic Ellipsometry Aotmane EN NACIRI sciencesconf.org:jmc15:112495
OS3 Characterization and modeling of nanoparticles optical properties: advances and recent trends Yann Battie, Aotmane En Naciri, Bruno Gallas, Michel Voué sciencesconf.org:jmc15:83149

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